Hsu et al. Provided by different

 Hsu et al. Provided by different vendors LED accelerated life test sample, the test samples were   MR16  placed in the LED 80,100,120 ℃, using 3.2V voltage drive, and provides the optical power of the sample down to the starting value 50%, it is determined to be invalid. Figure 1 The results show that: the lifetime of high power LED with temperature accelerated life test, and the acceleration time increases. In the accelerated life test, LED junction temperature will make the  T8 Tube epoxy material mutation occurs, thereby increasing the system's thermal resistance between the chip and package so that the heating surface degradation occurs, eventually leading to package failure [9].

(4) electrical overstress failure  LED Flexi

If the over-current LED case of use (EOS) or static shock damage (ESD) of the chip, the chip will result in an open, forming an electrical overstress failure. For example, GaN is a wide bandgap materials have high resistivity. If the use of such chips in the production process caused by electrostatic induced charge is not easy to disappear, when it accumulated to a considerable extent, can produce very high electrostatic voltage, this voltage once more than the capacity of the material occurs breakdown and discharge, making the device failure.